Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test StationNicola A. Tyler 1, Sylvain Guerber 1, Daivid Fowler 1, Stephane Malhouitre 1, Stephanie Garcia 1, Philippe Grosse 1, Bertrand Szelag 1
1University Grenoble Alpes and CEA, LETI, Minatec Campus
Here, we describe the operation of a SiN integrated photonic circuit containing optical phased arrays. The circuits are used to emit low divergence laser beams in the near infrared and steer them in two dimensions.
